Nuclear EMP: Will Your Electronics Survive?

This article explores the destructive effects of electromagnetic pulses (EMPs) generated by nuclear detonations on electronic devices. High-altitude nuclear explosions produce widespread EMPs, capable of causing significant damage to electronics even tens or hundreds of kilometers from the blast. EMPs are divided into three phases: E1, the most destructive and short-lived, instantly frying unprotected electronics; E2, longer-lasting but less destructive; and E3, the longest-lasting, primarily affecting long conductors and power infrastructure. The article suggests using Faraday cages and similar methods to protect electronics and points out that modern devices are far more vulnerable to EMP damage than older technologies.